The range of penetration of these particles increases significantly with incident particle energy. A transient disturbance to the output from the device (single-event transient—SET); A permanent but correctable flip of one or more bits (single-event upset—SEU), If an upset of multiple bits is in a single data word, it is a multi-bit upset (MBU), or. To prevent dramatic consequences of SEL the device must be equipped with security components which detects over-current and cuts off power supply. Space Radiation Effects on Electronics presented by Kenneth A. LaBel at 2004 MRS Fall Meeting, Boston, MA – Nov 29, 2004 Radiation Effects on Electronics and the Space Environment • Three portions of the natural space environment contribute to the radiation hazard – Solar particles • Protons and heavier ions – SEE, TID, DD – Free-space particles of the space radiation on electronic devices are the limits in shielding effectiveness for high-energy electrons, protons, and cosmic rays. Figure 2.5 demonstrates the occurrence of the most important spacecraft anomalies caused by the on-orbit environment. This is in contrast to TID, which is a cumulative effect over the life of the spacecraft. Wir verwenden Cookies und ähnliche Tools, um Ihr Einkaufserlebnis zu verbessern, um unsere Dienste anzubieten, um zu verstehen, wie die Kunden unsere Dienste nutzen, damit wir Verbesserungen vornehmen können, und um Werbung anzuzeigen. Bombardment by heavy ions to the lower part of the gate will produce high-density plasma in the vicinity of the ion’s track within the substrate. Tools and resources to help you design for aerospace and defense applications. In the case of TID, there is a cumulative impact from collection of free charge from radiation passing though material over the duration of the mission. Wählen Sie die Kategorie aus, in der Sie suchen möchten. 0000008434 00000 n This chapter reviews the environments responsible for the effects of radiation on microelectronic components and describes the effects these environments have on microelectronics. Sie hören eine Hörprobe des Audible Hörbuch-Downloads. The key point illustrated in Figure 2.1 is that space is not a single place when discussing radiation, but a broad range of environments and conditions. Innovate with 100,000+ analog ICs and embedded processors, along with software, tools and the industry‘s largest sales/support staff. The REAG performs testing & analysis investigating the effects of radiation on electronics & photonics. Ready to take your reading offline? Testing at the Speed of Light evaluates the nation’s current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.
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